[期刊论文]


Time-resolved microscope system to image material response following localized laser energy deposition: exit surface damage in fused silica as a case example

作   者:
Rajesh N. Raman;

出版年:2011

页    码:013602 - 013602
出版社:SPIE-Intl Soc Optical Eng


摘   要:

The dynamics of material response following initial localized energy deposition by the laser pulse on the material's surface is still largely unknown. We describe a time-resolved microscope system that enables the study of the sequence of events and the individual processes involved during the entire timeline from the initial energy deposition to the final state of the material, typically associated with the formation of a crater on the surface. To best capture individual aspects of the damage timeline, this system can be configured to multiple imaging arrangements, such as multiview image acquisition at a single time point, multi-image acquisition at different time points of the same event, and tailored sensitivity to various aspects of the process. As a case example, we present results obtained with this system during laser-induced damage on the exit surface of fused silica.



关键字:

Imaging systems ; Particles ; Microscopes ; Polarization ; Silica ; Laser energy ; Laser beam diagnostics ; Image processing ; Laser induced damage ; Temporal resolution


所属期刊
Optical Engineering
ISSN: 0091-3286
来自:SPIE-Intl Soc Optical Eng