1[期刊论文]

Acceptance of imaging energy filters

作者：Stephan Uhlemann ;Harald Rose

来源：Ultramicroscopy. 1996 ;63(3-4):161-167.doi:10.1016/0304-3991(96)00054-X

出版社：Elsevier BV

全文购买

2[期刊论文]

Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

作者：Stephan Uhlemann ;Maximilian Haider

来源：Ultramicroscopy. 1998 ;72(3-4):109-119.doi:10.1016/S0304-3991(97)00102-2

出版社：Elsevier BV

全文购买

3[期刊论文]

Thermal magnetic field noise: Electron optics and decoherence

作者：Stephan Uhlemann ;Heiko Müller ;Joachim Zach 等

来源：Ultramicroscopy. 2015 ;151:199-210.doi:10.1016/j.ultramic.2014.11.022

出版社：Elsevier BV

全文购买

4[期刊论文]

A novel ground-potential monochromator design

作者：Felix Börrnert ;Stephan Uhlemann ;Heiko Müller 等

来源：Ultramicroscopy. 2023 ;253:113805.doi:10.1016/j.ultramic.2023.113805

出版社：Elsevier BV

全文购买

5[期刊论文]

Aplanatic imaging systems for the transmission electron microscope

作者：Heiko Müller ;Ingo Maßmann ;Stephan Uhlemann 等

来源：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2011 ;645(1):20-27.doi:10.1016/j.nima.2010.12.091

出版社：Elsevier BV

全文购买

6[期刊论文]

Electron microscopy image enhanced

作者：Maximilian Haider ;Stephan Uhlemann ;Eugen Schwan 等

来源：Nature. 1998 ;392(6678):768-769.doi:10.1038/33823

出版社：Springer Nature

全文购买

7[期刊论文]

A spherical-aberration-corrected 200kV transmission electron microscope

作者：Max Haider ;Harald Rose ;Stephan Uhlemann 等

来源：Ultramicroscopy. 1998 ;75(1):53-60.doi:10.1016/S0304-3991(98)00048-5

出版社：Elsevier BV

全文购买

8[期刊论文]

Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV

作者：Ryusuke Sagawa ;Akira Yasuhara ;Hiroki Hashiguchi 等

来源：Ultramicroscopy. 2022 ;233:113440.doi:10.1016/j.ultramic.2021.113440

出版社：Elsevier BV

全文购买

9[期刊论文]

Aberration-corrected optics: from an idea to a device

作者：Heiko Müller ;Stephan Uhlemann ;Peter Hartel 等

来源：Physics Procedia. 2008 ;1(1):167-178.doi:10.1016/j.phpro.2008.07.093

出版社：Elsevier BV

全文购买

10[期刊论文]

Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope

作者：Thomas Riedel ;Peter Hartel ;Martin Linck 等

来源：Microscopy and Microanalysis. 2020 ;26(S2):2150-2151.doi:10.1017/S1431927620020619

出版社：Cambridge University Press

全文购买